8NTS-XYZ-200-A - Piezo scanning stage with central hole

Piezo scanning stage with central hole
 
Double capacity sensor technology for feedback
Travel range in horizontal directions up to: 200 µm,
Travel range in vertical direction up to : 20 µm,
Ultra high resolution: 0.1 nm
Clear aperture diameter 45 mm
Low cost
Compact design and low weight
Suitable for universal applications
High stiffness
Compensated creep effect
Low frequency noise resistance
Ideal capable for microscopic application
Vacuum version available
 

Every year Standa Company supplies for laboratories and linear motion market thousands of unique translation and rotation positioners for wide spectrum of positioning applications. Nanometer and Sub-nanometer resolution is impossible to reach with high speed screw drives and linear motors, for this reason we have prepared product line based on piezo elements.

Series 8NTS are perfectly suitable for smooth sub nanometer translation of optical elements or probe in open and closed loop system.

Movable central part hangs on flexible springs and is driven with piezo actuators to ensure high stiffness and stability of application. 8NTS design provides excellent linearity and flatness of the movement, in contrast to the classical scanners based on piezoelectric tubes, where the scan surface is a sphere. In addition, plane-parallel scanners have higher mechanical strength, compared with fragile piezoelectric tubes.

Piezo scanning stage with central hole 8NTS-XYZ-200-A are equipped with capacitive displacement sensors for digital closed-loop control. It provides high accuracy and linearity of movement and eliminates the creep effect inherent for piezoceramics. Capacitance measurements are made with TDC (time-to-digital conversion) technology where all measuring electronics is located as close as possible to the sensors. Such a design leads to the low noise and high speed displacement control.

To control 8NTS-XYZ-200-A piezo stage, universal controllers 8NSC-3000 or 8NSC-1000 are used as well as NSpec software.

Applications of 8NTS-XYZ-200-A include scanning probe microscopy (e.g. atomic force microscopy), nanopositioning, metrology, biology research, microelectronics, micromanipulation etc.

 
Specifications
Motion properties
Active axisXYZ
XY range, µm200 x 200
Z range, µm20
Resolution (closed loop), nm1
Resolution (open loop), nm0.1
Angle tilting over the full range, °<0.01
Maximum scanning speed, Hz10
Control Properties
Electrical capacity XY axes, pF10
Electrical capacity Z axis, pF10
Mechanical Properties
Clear aperture diameter, mm45
Resonant frequency Z, kHz3
Resonant frequency XY, kHz1
Load capacity, g100
Operating temperature range, °C - 40…80
Dimensions, mm100 x 100 x 35 mm
MaterialAluminum
Ordering Information
Model Details
8NTS-XY(Z)-200-A Piezo scanning stage with central hole
8NTS-XY-200-A Piezo scanning stage with central hole
 


Piezo scanning stage with central hole